Capillary forces in tapping mode atomic force microscopy
نویسنده
چکیده
We investigated the influence of the relative humidity on amplitude and phase of the cantilever oscillation while operating an atomic force microscope ~AFM! in the tapping mode. If the free oscillation amplitude A0 exceeds a certain critical amplitude Ac , the amplitudeand phase-distance curves show a transition from a regime with a net attractive force between tip and sample to a net repulsive regime. For hydrophilic tip and sample this critical amplitude Ac is found to increase with increasing relative humidity. In contrast, no such dependence was found for hydrophobic samples. Numerical simulations show that this behavior can be explained by assuming the intermittent formation and rupture of a capillary neck in each oscillation cycle of the AFM cantilever.
منابع مشابه
The nonlinear dynamics of tapping mode atomic force microscopy with capillary force interactions
We study the nonlinear dynamics of a tapping mode atomic force microscope with tip-surface interactions that include attractive, repulsive, and capillary force contributions using numerical techniques tailored for hybrid or discontinuous dynamical systems that include forward-time simulation with event handling and numerical pseudo-arclength continuation. We find four branches of periodic solut...
متن کاملTapping mode atomic force microscopy in liquid
We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFhif in liquid. Acoustic modes in the liquid excite the canti1eve.r. On soft samples, e.g., biolog...
متن کاملHarnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements.
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever...
متن کاملSensitivity Analysis of Frequency Response of Atomic Force Microscopy in Liquid Environment on Cantilever's Geometrical Parameters
In this paper, the non-linear dynamic response of rectangular atomic force microscopy in tapping mode is considered. The effect of cantilever’s geometrical parameters (e.g., cantilever length, width, thickness, tip length and the angle between the cantilever and the sample's surface in liquid environment has been studied by taking into account the interaction forces. Results indicate that the r...
متن کاملFrequency and force modulation atomic force microscopy: low-impact tapping-mode imaging without bistability
Since the 1980s, atomic force microscopy (AFM) has rapidly developed into a versatile, high-resolution characterization technique, available in a variety of imaging modes. Within intermittent-contact tapping-mode, imaging bistability and sample mechanical damage continue to be two of the most important challenges faced daily by AFM users. Recently, a new double-control-loop tapping-mode imaging...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2002